A proposed standard test bus and boundary scan architecture. - Lee Whetsel (ICCD, 1988)

Event qualification: a gateway to at-speed system testing. - Lee Whetsel (ITC, 1990)

An IEEE 1149.1 Based Logic/Signature Analyzer in a Chip. - Lee Whetsel (ITC, 1991)

A Proposed Method of Accessing 1149.1 in a Backplane Environment. - Lee Whetsel (ITC, 1992)

Hierarchically Accessing 1149.1 Applications in a System Environment. - Lee Whetsel (ITC, 1993)

An IEEE 1149.1 based voltmeter/oscilloscope in a chip. - Lee Whetsel (VTS, 1993)

An Approach to Accelerate Scan Testing in IEEE 1149.1 Architectures. - Lee Whetsel (ITC, 1994)

Navigating Test Access in Systems. - Lee Whetsel (ITC, 1994)

Improved Boundary Scan Design. - Lee Whetsel (ITC, 1995)

Proposal to Simplify Development of a Mixed-Signal Test Standard. - Lee Whetsel (ITC, 1996)

An IEEE 1149.1-Based Test Access Architecture for ICs with Embedded Cores. - Lee Whetsel (ITC, 1997)

Test Access of TAP'ed & Non-TAP'ed Cores. - Lee Whetsel (ITC, 1997)

A silicon El Niño? - Lee Whetsel (IEEE Des. Test Comput., 1997)

Core test connectivity, communication, and control. - Lee Whetsel (ITC, 1998)

Addressable test ports an approach to testing embedded cores. - Lee Whetsel (ITC, 1999)

Towards a standard for embedded core test: an example. - Yervant Zorian; Erik Jan Marinissen; Rohit Kapur; Tony Taylor; Lee Whetsel (ITC, 1999)

Adapting scan architectures for low power operation. - Lee Whetsel (ITC, 2000)

An analysis of power reduction techniques in scan testing. - Jayashree Saxena; Kenneth M. Butler; Lee Whetsel (ITC, 2001)

Inevitable Use of TAP Domains in SOCs. - Lee Whetsel (ITC, 2002)

Overview of the IEEE P1500 Standard. - Francisco DaSilva; Yervant Zorian; Lee Whetsel; Karim Arabi; Rohit Kapur (ITC, 2003)

Evolution of IEEE 1149.1 Addressable Shadow Protocol Devices. - Rakesh N. Joshi; Kenneth L. Williams; Lee Whetsel (ITC, 2003)

Adapting JTAG for AC Interconnect Testing. - Lee Whetsel (ITC, 2003)

A High Speed Reduced Pin Count JTAG Interface. - Lee Whetsel (ITC, 2006)

Commanded Test Access Port operations. - Lee Whetsel (ITC, 2010)