Deep Learning for Apple Fruit Quality Inspection using X-Ray Imaging. - Astrid Tempelaere; Leen Van Doorselaer; Jiaqi He; Pieter Verboven; Tinne Tuytelaars; Bart M. Nicolaï (ICCV (Workshops), 2023)

Unsupervised anomaly detection for pome fruit quality inspection using X-ray radiography. - Astrid Tempelaere; Jiaqi He; Leen Van Doorselaer; Pieter Verboven; Bart M. Nicolaï; Mario Valerio Giuffrida (Comput. Electron. Agric., 2024)