Reliability and Availability Analysis for the JPL Remote Exploration and Experimentation System. - Dong Chen; Selvamuthu Dharmaraja; Dongyan Chen; Lei Li 036; Kishor S. Trivedi; Raphael R. Some; Allen P. Nikora (DSN, 2002)

An Approach for Estimation of Software Aging in a Web Server. - Lei Li 036; Kalyanaraman Vaidyanathan; Kishor S. Trivedi (ISESE, 2002)

On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume. - Seiji Kajihara; Yasumi Doi; Lei Li 036; Krishnendu Chakrabarty (ICCD, 2003)

Deterministic BIST Based on a Reconfigurable Interconnection Network. - Lei Li 036; Krishnendu Chakrabarty (ITC, 2003)

Test Data Compression Using Dictionaries with Fixed-Length Indices. - Lei Li 036; Krishnendu Chakrabarty (VTS, 2003)

Test data compression using dictionaries with selective entries and fixed-length indices. - Lei Li 036; Krishnendu Chakrabarty; Nur A. Touba (ACM Trans. Design Autom. Electr. Syst., 2003)

On Using Exponential-Golomb Codes and Subexponential Codes for System-on-a-Chip Test Data Compression. - Lei Li 036; Krishnendu Chakrabarty (J. Electron. Test., 2004)

Test set embedding for deterministic BIST using a reconfigurable interconnection network. - Lei Li 036; Krishnendu Chakrabarty (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004)

Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation. - Yasumi Doi; Seiji Kajihara; Xiaoqing Wen; Lei Li 036; Krishnendu Chakrabarty (ASP-DAC, 2005)

Hybrid BIST Based on Repeating Sequences and Cluster Analysis. - Lei Li 036; Krishnendu Chakrabarty (DATE, 2005)

Efficient Space/Time Compression to Reduce Test Data Volume and Testing Time for IP Cores. - Lei Li 036; Krishnendu Chakrabarty; Seiji Kajihara; Shivakumar Swaminathan (VLSI Design, 2005)

Analysis of Software Aging in a Web Server. - Michael Grottke; Lei Li 036; Kalyanaraman Vaidyanathan; Kishor S. Trivedi (IEEE Trans. Reliab., 2006)

Scan-BIST based on cluster analysis and the encoding of repeating sequences. - Lei Li 036; Zhanglei Wang; Krishnendu Chakrabarty (ACM Trans. Design Autom. Electr. Syst., 2007)