Low-Overhead Triple-Node-Upset-Tolerant Latch Design in 28-nm CMOS. - Xin Chen 039; Yuxin Bai; Jianpeng Cao; Lei Wang 226; Xinjie Zhou; Ying Zhang 068; Weiqiang Liu 001 (IEEE Trans. Very Large Scale Integr. Syst., 2023)

UNM: A Universal Approach for Noisy Multi-Label Learning. - Jia-Yao Chen; Shao-Yuan Li; Sheng-Jun Huang; Songcan Chen; Lei Wang 226; Ming-Kun Xie (IEEE Trans. Knowl. Data Eng., 2024)