Novel Radiation-Hardened-by-Design (RHBD) 12T Memory Cell for Aerospace Applications in Nanoscale CMOS Technology. - Jing Guo 004; Lei Zhu 004; Wenyi Liu; Hai Huang; Shanshan Liu 001; Tianqi Wang; Liyi Xiao; Zhigang Mao (IEEE Trans. Very Large Scale Integr. Syst., 2017)

Design of Area-Efficient and Highly Reliable RHBD 10T Memory Cell for Aerospace Applications. - Jing Guo 004; Lei Zhu 004; Yu Sun; Huiliang Cao; Hai Huang; Tianqi Wang; Chunhua Qi; Rongsheng Zhang; Xuebing Cao; Liyi Xiao; Zhigang Mao (IEEE Trans. Very Large Scale Integr. Syst., 2018)

A CMOS Majority Logic Gate and its Application to One-Step ML Decodable Codes. - Jing Guo 004; Shanshan Liu 001; Lei Zhu 004; Fabrizio Lombardi (IEEE Trans. Very Large Scale Integr. Syst., 2019)

Design and Evaluation of Low-Complexity Radiation Hardened CMOS Latch for Double-Node Upset Tolerance. - Jing Guo 004; Shanshan Liu 001; Lei Zhu 004; Fabrizio Lombardi (IEEE Trans. Circuits Syst. I Regul. Pap., 2020)