Critical charge calculations for a bipolar SRAM array. - Leo B. Freeman (IBM J. Res. Dev., 1996)

IBM experiments in soft fails in computer electronics (1978-1994). - James F. Ziegler; Huntington W. Curtis; Hans P. Muhlfeld; Charles J. Montrose; B. Chin; Michael Nicewicz; C. A. Russell; Wen Y. Wang; Leo B. Freeman; P. Hosier; L. E. LaFave; James L. Walsh; et al. (IBM J. Res. Dev., 1996)