Issues concerning charged device model ESD verification modules - the need to move to alumina. - Leo G. Henry; Mark A. Kelly; Tom Diep; Jon Barth (Microelectron. Reliab., 2001)

The importance of standardizing CDM ESD test head parameters to obtain data correlation. - Leo G. Henry; Mark A. Kelly; Tom Diep; Jon Barth (Microelectron. Reliab., 2001)

Charged device model metrology: limitations and problems. - Leo G. Henry; Jon Barth; Hugh Hyatt; Tom Diep; Michael Stevens (Microelectron. Reliab., 2002)