Applying the fWLR concept to Stress induced leakage current in non-volatile memory processes. - Guoqiao Tao; Andrea Scarpa; Leo van Marwijk; Kitty van Dijk; Fred G. Kuper (Microelectron. Reliab., 2004)

Fast electromigration wafer mapping for wafer fab process monitoring and improvement. - Yuan Li; Leo van Marwijk; Som Nath (Microelectron. Reliab., 2008)