Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis. - Ken Chau-Cheung Cheng; Katherine Shu-Min Li; Andrew Yi-Ann Huang; Ji-Wei Li; Leon Li-Yang Chen; Nova Cheng-Yen Tsai; Sying-Jyan Wang; Chen-Shiun Lee; Leon Chou; Peter Yi-Yu Liao; Hsing-Chung Liang; Jwu E. Chen (DATE, 2020)

TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning. - Leon Li-Yang Chen; Katherine Shu-Min Li; Ken Chau-Cheung Cheng; Sying-Jyan Wang; Andrew Yi-Ann Huang; Leon Chou; Nova Cheng-Yen Tsai; Chen-Shiun Lee (ITC, 2020)

Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering. - Katherine Shu-Min Li; Leon Li-Yang Chen; Ken Chau-Cheung Cheng; Peter Yi-Yu Liao; Sying-Jyan Wang; Andrew Yi-Ann Huang; Nova Cheng-Yen Tsai; Leon Chou; Gus Chang-Hung Han; Jwu E. Chen; Hsing-Chung Liang; Chun-Lung Hsu (ETS, 2021)

Integrated Scratch Marker for Wafer Defect Diagnosis. - Katherine Shu-Min Li; Leon Li-Yang Chen; Peter Yi-Yu Liao; Sying-Jyan Wang; Andrew Yi-Ann Huang; Ken Chau-Cheung Cheng (ITC-Asia, 2021)

Semi-Supervised Framework for Wafer Defect Pattern Recognition with Enhanced Labeling. - Leon Li-Yang Chen; Katherine Shu-Min Li; Xu-Hao Jiang; Sying-Jyan Wang; Andrew Yi-Ann Huang; Jwu E. Chen; Hsing-Chung Liang; Chun-Lung Hsu (ITC, 2021)

WGrid: Wafermap Grid Pattern Recognition with Machine Learning Techniques. - Peter Yi-Yu Liao; Katherine Shu-Min Li; Leon Li-Yang Chen; Sying-Jyan Wang; Andrew Yi-Ann Huang; Ken Chau-Cheung Cheng; Nova Cheng-Yen Tsai; Leon Chou (ITC, 2021)

Wafer Defect Pattern Classification with Explainable-Decision Tree Technique. - Ken Chau-Cheung Cheng; Katherine Shu-Min Li; Sying-Jyan Wang; Andrew Yi-Ann Huang; Chen-Shiun Lee; Leon Li-Yang Chen; Peter Yi-Yu Liao; Nova Cheng-Yen Tsai (ITC, 2022)