IEEE P1581: To Live or Let die? - Frans G. M. de Jong; Leon van de Logt (ITC, 2003)

An extension to JTAG for at-speed debug on a system. - Leon van de Logt; Frank van der Heyden; Tom Waayers (ITC, 2003)

Variance Reduction for Supply Ramp Based Cheap RF Test Alternatives. - Shaji Krishnan; Rene Jonker; Leon van de Logt (ETS, 2007)

Analog Test Interface for IEEE 1687 Employing Split SAR Architecture to Support Embedded Instrument Dependability Applications. - Jerrin Pathrose; Leon van de Logt; Hans G. Kerkhoff (DFT, 2019)

Model-driven AMS Test Setup Validation Tool prepared for IEEE P1687.2. - Leon M. A. van de Logt; Vladimir A. Zivkovic; Ingrid H. A. van Baast (ETS, 2019)