A new RTD-FET logic family. - Richard H. Mathews; Jay P. Sage; T. C. L. Gerhard Sollner; Stephen D. Calawa; Chang-Lee Chen; Leonard J. Mahoney; Paul A. Maki; Karen M. Molvar (Proc. IEEE, 1999)

Wafer-scale 3D integration of InGaAs image sensors with Si readout circuits. - Chang-Lee Chen; D.-R. Yost; Jeffrey M. Knecht; David C. Chapman; Douglas C. Oakley; Leonard J. Mahoney; Joseph P. Donnelly; Antonio M. Soares; Vyshnavi Suntharalingam; Robert Berger; V. Bolkhovsky; W. Hu; et al. (3DIC, 2009)