Exploring Multi-level Design to Mitigate Variability and Radiation Effects on 7nm FinFET Logic Cells. - Leonardo Heitich Brendler; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo Reis 001 (ICECS, 2018)

Evaluating the Impact of Process Variability and Radiation Effects on Different Transistor Arrangements. - Leonardo Heitich Brendler; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo Reis 001 (VLSI-SoC, 2018)

Process Variability Impact on the SET Response of FinFET Multi-level Design. - Leonardo Heitich Brendler; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo Reis 001 (VLSI-SoC (Selected Papers), 2019)

Evaluation of SET under Process Variability on FinFET Multi-level Design. - Leonardo Heitich Brendler; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo A. L. Reis (VLSI-SoC, 2019)

Impact of Process Variability and Single Event Transient on FinFET Technology. - Leonardo Heitich Brendler; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo A. L. Reis (VLSI-SoC, 2019)

Work-Function Fluctuation Impact on the SET Response of FinFET-based Majority Voters. - Leonardo Heitich Brendler; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo Augusto da Luz Reis (LATS, 2020)

Circuit Level Design Methods to Mitigate Soft Errors. - Ricardo A. L. Reis; Cristina Meinhardt; Alexandra L. Zimpeck; Leonardo Heitich Brendler; Leonardo B. Moraes (LATS, 2020)

Multi-Level Design Influences on Robustness Evaluation of 7nm FinFET Technology. - Leonardo Heitich Brendler; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo Augusto da Luz Reis (IEEE Trans. Circuits Syst. I Regul. Pap., 2020)

Voltage Scaling Influence on the Soft Error Susceptibility of a FinFET-based Circuit. - Leonardo Heitich Brendler; Alexandra L. Zimpeck; Fernanda Lima Kastensmidt; Cristina Meinhardt; Ricardo A. L. Reis (LASCAS, 2021)

Exploring Gate Mapping and Transistor Sizing to Improve Radiation Robustness: A C17 Benchmark Case-study. - Bernardo Borges Sandoval; Leonardo Heitich Brendler; Alexandra L. Zimpeck; Fernanda Lima Kastensmidt; Ricardo Reis 001; Cristina Meinhardt (LATS, 2021)

A Tool for Automatic Radiation-Hardened SRAM Layout Generation. - Leonardo Heitich Brendler; Hervé Lapuyade; Yann Deval; Ricardo Reis 001; François Rivet (ICECS, 2023)

Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation. - Bernardo Borges Sandoval; Leonardo Heitich Brendler; Fernanda Lima Kastensmidt; Ricardo Reis 001; Alexandra L. Zimpeck; Rafael B. Schvittz; Cristina Meinhardt (ISCAS, 2023)

A MCU-robust Interleaved Data/Detection SRAM for Space Environments. - Leonardo Heitich Brendler; Hervé Lapuyade; Yann Deval; Ricardo Reis 001; François Rivet (ISVLSI, 2023)

A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures. - Cleiton Magano Marques; Leonardo Heitich Brendler; Frédéric Wrobel; Alexandra L. Zimpeck; Walter E. Calienes Bartra; Paulo F. Butzen; Cristina Meinhardt (SBCCI, 2023)

A Proof-of-Concept of a Multiple-Cell Upsets Detection Method for SRAMs in Space Applications. - Leonardo Heitich Brendler; Hervé Lapuyade; Yann Deval; Frédéric Darracq; Frédéric Fauquet; Ricardo Reis 001; François Rivet (IEEE Trans. Circuits Syst. I Regul. Pap., 2023)