A New Defect Model due to a Dust Particle Affecting the Fingers of FinFET Logic Gates. - Víctor H. Champac; Freddy Forero; Michel Renovell; Leonardo Miceli (LATS, 2023)

Fault Analysis for a MTJ-based Spiking Neural Network. - Leonardo Miceli; Elena-Ioana Vatajelu; Víctor H. Champac (LATS, 2024)