Let's make it Noisy: A Simulation Methodology for adding Intrinsic Physical Noise to Cryptographic Designs. - Kashif Nawaz; Léopold Van Brandt; François-Xavier Standaert; Denis Flandre (PRIME, 2018)

A security oriented transient-noise simulation methodology: Evaluation of intrinsic physical noise of cryptographic designs. - Kashif Nawaz; Léopold Van Brandt; Itamar Levi; François-Xavier Standaert; Denis Flandre (Integr., 2019)

Accurate and Insightful Closed-Form Prediction of Subthreshold SRAM Hold Failure Rate. - Léopold Van Brandt; Roghayeh Saeidi; David Bol; Denis Flandre (IEEE Trans. Circuits Syst. I Regul. Pap., 2022)

Comprehensive Analytical Comparison of Ring Oscillators in FDSOI Technology: Current Starving Versus Back-Bias Control. - Maxime Schramme; Léopold Van Brandt; Denis Flandre; David Bol (IEEE Trans. Circuits Syst. I Regul. Pap., 2022)

Variability-Aware Noise-Induced Dynamic Instability of Ultra-Low-Voltage SRAM Bitcells. - Léopold Van Brandt; Jean-Charles Delvenne; Denis Flandre (LASCAS, 2024)

Stochastic Nonlinear Dynamical Modelling of SRAM Bitcells in Retention Mode. - Léopold Van Brandt; Denis Flandre; Jean-Charles Delvenne (CoRR, 2024)

Predicting State Transitions in Autonomous Nonlinear Bistable Systems With Hidden Stochasticity. - Léopold Van Brandt; Jean-Charles Delvenne (IEEE Control. Syst. Lett., 2024)

Modeling and Predicting Noise-Induced Failure Rates in Ultra-Low-Voltage SRAM Bitcells Affected by Process Variations. - Léopold Van Brandt; Michele Bonnin; Maurício Banaszeski da Silva; Pascal Bolcato; Gilson I. Wirth; Denis Flandre; Jean-Charles Delvenne (IEEE Trans. Circuits Syst. I Regul. Pap., 2025)