Outsourcing DFT: it can be done but it isn't easy. - LeRoy Winemberg (ITC, 2005)

Detecting and diagnosing open defects. - Dat Tran; LeRoy Winemberg; Darrell Carder; Xijiang Lin; Joe LeBritton; Bruce Swanson (ITC, 2010)

In-field aging measurement and calibration for power-performance optimization. - Shuo Wang; Mohammad Tehranipoor; LeRoy Winemberg (DAC, 2011)

Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits. - Dragoljub Gagi Drmanac; Nik Sumikawa; LeRoy Winemberg; Li-C. Wang; Magdy S. Abadir (DATE, 2011)

Critical Fault-Based Pattern Generation for Screening SDDs. - Fang Bao; Ke Peng; Mahmut Yilmaz; Krishnendu Chakrabarty; LeRoy Winemberg; Mohammad Tehranipoor (ETS, 2011)

Forward prediction based on wafer sort data - A case study. - Nik Sumikawa; Dragoljub Gagi Drmanac; Li-C. Wang; LeRoy Winemberg; Magdy S. Abadir (ITC, 2011)

Case Study: Efficient SDD test generation for very large integrated circuits. - Ke Peng; Fang Bao; Geoff Shofner; LeRoy Winemberg; Mohammad Tehranipoor (VTS, 2011)

Understanding customer returns from a test perspective. - Nik Sumikawa; Dragoljub Gagi Drmanac; Li-C. Wang; LeRoy Winemberg; Magdy S. Abadir (VTS, 2011)

Special session 5B: Panel How much toggle activity should we be testing with? - Xiaoqing Wen; Mohammad Tehranipoor; Rohit Kapur; Anand Bhat; Amitava Majumdar 002; LeRoy Winemberg (VTS, 2011)

Special session: Hot topic: Smart silicon. - LeRoy Winemberg; Mohammad Tehranipoor (VTS, 2011)

Screening customer returns with multivariate test analysis. - Nik Sumikawa; Jeff Tikkanen; Li-C. Wang; LeRoy Winemberg; Magdy S. Abadir (ITC, 2012)

Radic: A standard-cell-based sensor for on-chip aging and flip-flop metastability measurements. - Xiaoxiao Wang 001; Dat Tran; Saji George; LeRoy Winemberg; Nisar Ahmed; Steve Palosh; Allan Dobin; Mohammad Tehranipoor (ITC, 2012)

Design and Analysis of a Delay Sensor Applicable to Process/Environmental Variations and Aging Measurements. - Xiaoxiao Wang 001; Mohammad Tehranipoor; Saji George; Dat Tran; LeRoy Winemberg (IEEE Trans. Very Large Scale Integr. Syst., 2012)

Fault analysis and simulation of large scale industrial mixed-signal circuits. - Ender Yilmaz; Geoff Shofner; LeRoy Winemberg; Sule Ozev (DATE, 2013)

Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults. - Fang Bao; Ke Peng; Mahmut Yilmaz; Krishnendu Chakrabarty; LeRoy Winemberg; Mohammad Tehranipoor (J. Electron. Test., 2013)

On-chip sensor selection for effective speed-binning. - Qihang Shi; Mohammad Tehranipoor; Xiaoxiao Wang 001; LeRoy Winemberg (MWSCAS, 2014)

Identification of testable representative paths for low-cost verification of circuit performance during manufacturing and in-field tests. - Jifeng Chen; LeRoy Winemberg; Mohammad Tehranipoor (VTS, 2014)

Predictive LBIST model and partial ATPG for seed extraction. - Gustavo K. Contreras; Nisar Ahmed; LeRoy Winemberg; Mark Tehranipoor (DFTS, 2015)

Speed Binning Using Machine Learning And On-chip Slack Sensors. - Mehdi Sadi; Mark Tehranipoor; Xiaoxiao Wang 001; LeRoy Winemberg (ACM Great Lakes Symposium on VLSI, 2015)

LBIST pattern reduction by learning ATPG test cube properties. - Gustavo K. Contreras; Yang Zhao; Nisar Ahmed; LeRoy Winemberg; Mohammad Tehranipoor (ISQED, 2015)

Generalization of an outlier model into a "global" perspective. - Sebastian Siatkowski; Chia-Ling Chang; Li-C. Wang; Nikolas Sumikawa; LeRoy Winemberg; W. Robert Daasch (ITC, 2015)

A robust digital sensor IP and sensor insertion flow for in-situ path timing slack monitoring in SoCs. - Mehdi Sadi; LeRoy Winemberg; Mark Tehranipoor (VTS, 2015)

Aging Adaption in Integrated Circuits Using a Novel Built-In Sensor. - Xiaoxiao Wang 001; LeRoy Winemberg; Donglin Su; Dat Tran; Saji George; Nisar Ahmed; Steve Palosh; Allan Dobin; Mark Tehranipoor (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015)

An efficient all-digital IR-Drop Alarmer for DVFS-based SoC. - Liting Yu; Xiaoxiao Wang 001; Yuanqing Cheng; Xiaoying Zhao; Pengyuan Jiao; Aixin Chen; Donglin Su; LeRoy Winemberg; Mehdi Sadi; Mark Tehranipoor (ISCAS, 2016)

BIST-RM: BIST-assisted reliability management of SoCs using on-chip clock sweeping and machine learning. - Mehdi Sadi; Gustavo K. Contreras; Dat Tran; Jifeng Chen; LeRoy Winemberg; Mark Tehranipoor (ITC, 2016)

Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture. - Fanchen Zhang; Daphne Hwong; Yi Sun; Allison Garcia; Soha Alhelaly; Geoff Shofner; LeRoy Winemberg; Jennifer Dworak (ITC, 2016)

Test-point insertion efficiency analysis for LBIST applications. - Miao Tony He; Gustavo K. Contreras; Mark Tehranipoor; Dat Tran; LeRoy Winemberg (VTS, 2016)

A Novel Peak Power Supply Noise Measurement and Adaptation System for Integrated Circuits. - Xiaoxiao Wang 001; Dongrong Zhang; Donglin Su; LeRoy Winemberg; Mark Tehranipoor (IEEE Trans. Very Large Scale Integr. Syst., 2016)

Evaluation of loop transfer function based dynamic testing of LDOs. - Mehmet Ince; Ender Yilmaz; Jae Woong Jeong; LeRoy Winemberg; Sule Ozev (ITC-Asia, 2017)

Built-in self-test for stability measurement of low dropout regulator. - Jae Woong Jeong; Ender Yilmaz; LeRoy Winemberg; Sule Ozev (ITC, 2017)

Some considerations on choosing an outlier method for automotive product lines. - Li-C. Wang; Sebastian Siatkowski; Chuanhe Jay Shan; Matthew Nero; Nikolas Sumikawa; LeRoy Winemberg (ITC, 2017)

Learning the process for correlation analysis. - Sebastian Siatkowski; Li-C. Wang; Nik Sumikawa; LeRoy Winemberg (VTS, 2017)

SoC Speed Binning Using Machine Learning and On-Chip Slack Sensors. - Mehdi Sadi; Sukeshwar Kannan; LeRoy Winemberg; Mark Tehranipoor (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017)

TRO: An On-Chip Ring Oscillator-Based GHz Transient IR-Drop Monitor. - Xiaoxiao Wang 001; Pengyuan Jiao; Mehdi Sadi; Donglin Su; LeRoy Winemberg; Mark Tehranipoor (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017)

Test-Point Insertion Efficiency Analysis for LBIST in High-Assurance Applications. - Miao Tony He; Gustavo K. Contreras; Dat Tran; LeRoy Winemberg; Mark Tehranipoor (IEEE Trans. Very Large Scale Integr. Syst., 2017)

Design of Reliable SoCs With BIST Hardware and Machine Learning. - Mehdi Sadi; Gustavo K. Contreras; Jifeng Chen; LeRoy Winemberg; Mark Tehranipoor (IEEE Trans. Very Large Scale Integr. Syst., 2017)

Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection. - Mehmet Ince; Ender Yilmaz; Wei Fu; Joonsung Park; Krishnaswamy Nagaraj; LeRoy Winemberg; Sule Ozev (ETS, 2019)

Fault-based Built-in Self-test and Evaluation of Phase Locked Loops. - Mehmet Ince; Ender Yilmaz; Wei Fu; Joonsung Park; Krishnaswamy Nagaraj; LeRoy Winemberg; Sule Ozev (ACM Trans. Design Autom. Electr. Syst., 2021)