Acceleration factors for THB induced degradation of AlGaAs/InGaAs pHEMT devices. - Leslie Marchut; Charles S. Whitman (Microelectron. Reliab., 2008)

Application of Machine Model ESD tester to high volume capacitor reliability testing. - Michael Meeder; Leslie Marchut; Michael J. Antonell; Michael T. Fresina; Christopher E. Novak; Terry C. Darche (Microelectron. Reliab., 2011)

Analysis of in situ monitored thermal cycling benefits for wireless packaging early reliability evaluation. - Michael Ferrara; Michael Stephens; Leslie Marchut; Chris Yang; Ventony Fryar; Preston Scott (Microelectron. Reliab., 2012)

Process reliability screening in situ. - Leslie Marchut; Michael G. Meeder; Terrence Stark (Microelectron. Reliab., 2014)