A wearable real-time fall detector based on Naive Bayes classifier. - Xiuxin Yang; Anh Dinh; Li Chen 001 (CCECE, 2010)

A new Bulk Built-In Current Sensing circuit for single-event transient detection. - Zhichao Zhang; Tao Wang; Li Chen 001; Jinsheng Yang (CCECE, 2010)

A broadband high linear LNA for GSM/LTE wireless communications. - Zhichao Zhang; Muhammad Raashid Khan; Li Chen 001; Anh Dinh (CCECE, 2012)

A 2 GHz bandwidth LNA using resistive feedback with added inductor. - Zhichao Zhang; Anh Dinh; Li Chen 001 (ICUWB, 2012)

Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter. - Yi Ren; L. Fan; Li Chen 001; Shi-Jie Wen; Richard Wong; N. W. van Vonno; Arthur F. Witulski; Bharat L. Bhuva (J. Electron. Test., 2012)

Synthesis of Redundant Combinatorial Logic for Selective Fault Tolerance. - Hao Xie; Li Chen 001; Adrian Evans; Shi-Jie Wen; Rick Wong (PRDC, 2013)

Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller. - Yi Ren; Shuting Shi; Li Chen 001; Haibin Wang; L.-J. Gao; Gang Guo; Shi-Jie Wen; Richard Wong; N. W. van Vonno (J. Electron. Test., 2013)

A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients. - Zhichao Zhang; Yi Ren; Li Chen 001; Nelson J. Gaspard; Arthur F. Witulski; W. Timothy Holman; Bharat L. Bhuva; Shi-Jie Wen; Ramaswami Sammynaiken (J. Electron. Test., 2013)

A low noise figure 2-GHz bandwidth LNA using resistive feedback with additional input inductors. - Zhichao Zhang; Anh Dinh; Li Chen 001; Muhammad Raashid Khan (IEICE Electron. Express, 2013)

A high linear broadband cascode LNA employing common-gate linearity enhancing technology. - Zhichao Zhang; Muhammad Raashid Khan; Anh Dinh; Li Chen 001 (IEICE Electron. Express, 2013)

New approaches for synthesis of redundant combinatorial logic for selective fault tolerance. - Hao Xie; Li Chen 001; Rui Liu 011; Adrian Evans; Dan Alexandrescu; Shi-Jie Wen; Rick Wong (IOLTS, 2014)

The Effect of Temperature-Induced Quiescent Operating Point Shift on Single-Event Transient Sensitivity in Analog/Mixed-Signal Circuits. - Yi Ren; Li Chen 001 (J. Electron. Test., 2014)

Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser. - Yi Ren; Anlin He; Shuting Shi; Gang Guo; Li Chen 001; Shi-Jie Wen; Richard Wong; N. W. van Vonno; Bharat L. Bhuva (J. Electron. Test., 2014)

Single Event Resilient Dynamic Logic Designs. - Haibin Wang; Mulong Li; Li Chen 001; Rui Liu 011; Sanghyeon Baeg; Shi-Jie Wen; Richard Wong; Rita Fung; Jinshun Bi (J. Electron. Test., 2014)

A novel asymmetrical SRAM cell tolerant to soft errors. - Lixiang Li 001; Yuanqing Li; Yuan Ma; Li Chen 001 (CCECE, 2015)

Analysis of advanced circuits for SET measurement. - Rui Liu 011; Adrian Evans; Qiong Wu; Yuanqing Li; Li Chen 001; Shi-Jie Wen; Rick Wong; Rita Fung (IRPS, 2015)

Simulation and Experimental Evaluation of a Soft Error Tolerant Layout for SRAM 6T Bitcell in 65nm Technology. - Lixiang Li 001; Yuanqing Li; Haibin Wang; Rui Liu 011; Qiong Wu; Michael Newton; Yuan Ma; Li Chen 001 (J. Electron. Test., 2015)

A Novel Built-in Current Sensor for N-WELL SET Detection. - Haibin Wang; Rui Liu 011; Li Chen 001; Jinshun Bi; Mulong Li; Yuanqing Li (J. Electron. Test., 2015)

Single photon absorption laser facility for single event effect testing. - Michael Newton; Brook Danger; Li Chen 001; Ramaswami Sammynaiken; Haibin Wang; David M. Hiemstra; Valeri Kirischian (CCECE, 2016)

Total ionizing dose test facilities for micro-electronic circuits. - Haibin Wang; Rui Liu 011; Xuantian Li; Li Chen 001; David M. Hiemstra; Valeri Kirischian (CCECE, 2016)

Instruction-Vulnerability-Factor-Based Reliability Analysis Model for Program Memory. - Qingyu Chen; Li Chen 001; Haibin Wang; Longsheng Wu; Yuanqing Li; Xing Zhao; Mo Chen 008 (J. Electron. Test., 2016)

An SEU-Resilient SRAM Bitcell in 65-nm CMOS Technology. - Qingyu Chen; Haibin Wang; Li Chen 001; Lixiang Li 001; Xing Zhao; Rui Liu 011; Mo Chen 008; Xuantian Li (J. Electron. Test., 2016)

A 10-Transistor 65 nm SRAM Cell Tolerant to Single-Event Upsets. - Yuanqing Li; Lixiang Li 001; Yuan Ma; Li Chen 001; Rui Liu 011; Haibin Wang; Qiong Wu; Michael Newton; Mo Chen 008 (J. Electron. Test., 2016)

A Built-in Single Event Upsets Detector for Sequential Cells. - Yuanqing Li; Haibin Wang; Lixiang Li 001; Li Chen 001; Rui Liu 011; Mo Chen 008 (J. Electron. Test., 2016)

Layout-based Single Event Mitigation Techniques for Dynamic Logic Circuits. - Haibin Wang; Mulong Li; Xixi Dai; Shuting Shi; Li Chen 001; Gang Guo (J. Electron. Test., 2016)

A 0.1-8 GHz wideband low-noise amplifier exploiting gain-enhanced noise-cancelling technique. - Zhichao Zhang; Anh Dinh; Li Chen 001 (IEICE Electron. Express, 2016)

BPPT - Bulk potential protection technique for hardened sequentials. - Issam Nofal; Adrian Evans; Anlin He; Gang Guo; Yuanqing Li; Li Chen 001; Rui Liu 011; Haibin Wang; Mo Chen 008; Sang H. Baeg; Shi-Jie Wen; Richard Wong (IOLTS, 2017)

Wide range linearity improvement technique for linear wideband LNA. - Zhichao Zhang; Anh Dinh; Li Chen 001; Haibin Wang (IEICE Electron. Express, 2017)

SEU reduction effectiveness of common centroid layout in differential latch at 130-nm CMOS technology. - Haibin Wang; Ao Sheng; Shiqi Wang 010; Jinshun Bi; Li Chen 001; Xiaofeng Liu 006 (Microelectron. Reliab., 2017)

A Hardened-By-Design Technique for LC-Tank Voltage Controlled Oscillator. - Zhichao Zhang; Li Chen 001; Hormoz Djahanshahi (CCECE, 2018)

A SEE Insensitive CML Voltage Controlled Oscillator in 65nm CMOS. - Zhichao Zhang; Li Chen 001; Hormoz Djahanshahi (CCECE, 2018)

Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. - Yuanqing Li; Li Chen 001; Issam Nofal; Mo Chen 008; Haibin Wang; Rui Liu 011; Qingyu Chen; Milos Krstic; Shuting Shi; Gang Guo; Sang H. Baeg; Shi-Jie Wen; et al. (Microelectron. Reliab., 2018)

A single event upset tolerant latch design. - Haibin Wang; Xixi Dai; Yangsheng Wang; Issam Nofal; Li Cai; Zicai Shen; Wanxiu Sun; Jinshun Bi; Bo Li 051; Gang Guo; Li Chen 001; Sang H. Baeg (Microelectron. Reliab., 2018)

A Radiation-Tolerant CML Voltage Controlled Oscillator in 28nm CMOS FDSOI. - Jaime Cardenas 001; Abdul Khan; Li Chen 001; Zhichao Zhang; Muhammad Khan (CCECE, 2019)

A Low Power and Low Noise Voltage-Controlled Oscillator in 28-nm FDSOI Technology for Wireless Communication Applications. - Abdul Baseer Khan; Jaime Cardenas 001; Li Chen 001; Muhammad Raashid Khan; Aqeel Qureshi (CCECE, 2019)

A Layout-Based Rad-Hard DICE Flip-Flop Design. - Haibin Wang; Xixi Dai; Younis Mohammed Younis Ibrahim; Hongwen Sun; Issam Nofal; Li Cai; Gang Guo; Zicai Shen; Li Chen 001 (J. Electron. Test., 2019)

Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor. - Shuting Shi; Rui Chen; Rui Liu 011; Mo Chen 008; Chen Shen; Xuantian Li; Haonan Tian; Li Chen 001 (J. Electron. Test., 2021)

Radiation Tolerant SRAM Cell Design in 65nm Technology. - JianAn Wang; Xue Wu; Haonan Tian; Lixiang Li 003; Shuting Shi; Li Chen 001 (J. Electron. Test., 2021)

STACKION: Ion Channel-Modulating Peptides Identification Using Stacking-Based Ensemble Machine Learning. - Md Mamun Ali; Kawsar Ahmed; Francis M. Bui; Li Chen 001 (CCECE, 2023)

FedRSMax: An Effective Aggregation Technique for Federated Learning with Medical Images. - Md. Nazmul Hossen; Kawsar Ahmed; Francis M. Bui; Li Chen 001 (CCECE, 2023)

An Intelligent Thyroid Diagnosis System Utilizing Multiple Ensemble and Explainable Algorithms With Medical Supported Attributes. - Ananda Sutradhar; Mustahsin Al Rafi; Pronab Ghosh; F. M. Javed Mehedi Shamrat; Md. Moniruzzaman; Kawsar Ahmed; A. K. M. Azad; Francis M. Bui; Li Chen 001; Mohammad Ali Moni (IEEE Trans. Artif. Intell., 2024)

StackAMP: Stacking-Based Ensemble Classifier for Antimicrobial Peptide Identification. - Tasmin Karim; Md. Shazzad Hossain Shaon; Md Mamun Ali; Kawsar Ahmed; Francis M. Bui; Li Chen 001 (IEEE Trans. Artif. Intell., 2024)

Study on Single Event Transients in Amplifier for Switched-Capacitor Circuits in CMOS Technology. - Ming Yan; Jaime Cardenas Chavez; Adriana Noguera Cundar; Kamal El-Sankary; Li Chen 001 (IEEE Access, 2025)

A 10-bit 50-MS/s Radiation Tolerant Split Coarse/Fine SAR ADC in 65-nm CMOS. - Ming Yan; Jaime Cardenas Chavez; Kamal El-Sankary; Li Chen 001; Xiaotong Lu (IEEE Trans. Very Large Scale Integr. Syst., 2025)