A dual-rail static edge-triggered latch. - Li Ding 002; Pinaki Mazumder; N. Srinivas (ISCAS (2), 2001)

Optimal Transistor Tapering for High-Speed CMOS Circuits. - Li Ding 002; Pinaki Mazumder (DATE, 2002)

Accurate Estimating Simultaneous Switching Noises by Using Application Specific Device Modeling. - Li Ding 002; Pinaki Mazumder (DATE, 2002)

Efficient crosstalk noise modeling using aggressor and tree reductions. - Li Ding 002; David T. Blaauw; Pinaki Mazumder (ICCAD, 2002)

Modified long channel model for analytical study of DSM circuits. - Li Ding 002; Pinaki Mazumder (ISCAS (5), 2002)

Crosstalk noise estimation using effective coupling capacitance. - Li Ding 002; Pinaki Mazumder; David T. Blaauw (ISCAS (5), 2002)

Novel macromodeling for on-chip RC/RLC interconnects. - Qinwei Xu; Pinaki Mazumder; Li Ding 002 (ISCAS (4), 2002)

Modeling Noise Transfer Characteristic of Dynamic Logic Gates. - Li Ding 002; Pinaki Mazumder (DATE, 2003)

Performance modeling of resonant tunneling based RAMs. - Hui Zhang; Pinaki Mazumder; Li Ding 002; Kyounghoon Yang (ISCAS (4), 2003)

The Impact of Bit-Line Coupling and Ground Bounce on CMOS SRAM Performance. - Li Ding 002; Pinaki Mazumder (VLSI Design, 2003)

Accurate crosstalk noise modeling for early signal integrity analysis. - Li Ding 002; David T. Blaauw; Pinaki Mazumder (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2003)

Simultaneous switching noise analysis using application specific device modeling. - Li Ding 002; Pinaki Mazumder (IEEE Trans. Very Large Scale Integr. Syst., 2003)

A novel technique to improve noise immunity of CMOS dynamic logic circuits. - Li Ding 002; Pinaki Mazumder (DAC, 2004)

Dynamic Noise Margin: Definitions and Model. - Li Ding 002; Pinaki Mazumder (VLSI Design, 2004)

On circuit techniques to improve noise immunity of CMOS dynamic logic. - Li Ding 002; Pinaki Mazumder (IEEE Trans. Very Large Scale Integr. Syst., 2004)

Fast Sequential Cell Noise Immunity Characterization Using Meta-stable Point of Feedback Loop. - Nahmsuk Oh; Li Ding 002; Alireza Kasnavi (ISQED, 2006)

TBNM - Transistor-Level Boundary Model for Fast Gate-Level Noise Analysis of Macro Blocks. - Jindrich Zejda; Li Ding 002 (ISQED, 2006)

Worst-case aggressor-victim alignment with current-source driver models. - Ravikishore Gandikota; Li Ding 002; Peivand Tehrani; David T. Blaauw (DAC, 2009)