Electrical method to localize the high-resistance of nanoscale CoSi2 word-line for OTP memories. - Ming-Yi Lee; T.-Y. Chang; W.-F. Hsueh; Li-Kuang Kuo; Ding-Jhang Lin; Yen-Hai Chao; U. J. Tzeng; Chih-Yuan Lu (IRPS, 2018)

Modeling of Apparent Activation Energy and Lifetime Estimation for Retention of 3D SGVC Memory. - Wei-Hao Hsiao; Nian-Jia Wang; Ming-Yi Lee; Li-Kuang Kuo; Ding-Jhang Lin; Yen-Hai Chao; Chih-Yuan Lu (IRPS, 2019)

Statistical Analysis of Bit-Errors Distribution for Reliability of 3-D NAND Flash Memories. - Nian-Jia Wang; Kuan-Yi Lee; Hsin-Yi Lin; Wei-Hao Hsiao; Ming-Yi Lee; Li-Kuang Kuo; Ding-Jhang Lin; Yen-Hai Chao; Chih-Yuan Lu (IRPS, 2020)