Compensation of systematic variations through optimal biasing of SRAM wordlines. - Andrew Carlson; Zheng Guo; Liang-Teck Pang; Tsu-Jae King Liu; Borivoje Nikolic (CICC, 2008)

Measurement and analysis of variability in 45nm strained-Si CMOS technology. - Liang-Teck Pang; Borivoje Nikolic (CICC, 2008)

Fixed- and variable-length ring oscillators for variability characterization in 45nm CMOS. - Ji-Hoon Park; Liang-Teck Pang; Kenneth Duong; Borivoje Nikolic (CICC, 2009)

Large-Scale SRAM Variability Characterization in 45 nm CMOS. - Zheng Guo; Andrew Carlson; Liang-Teck Pang; Kenneth Duong; Tsu-Jae King Liu; Borivoje Nikolic (IEEE J. Solid State Circuits, 2009)

Measurements and Analysis of Process Variability in 90nmCMOS. - Liang-Teck Pang; Borivoje Nikolic (IEEE J. Solid State Circuits, 2009)

Measurement and Analysis of Variability in 45 nm Strained-Si CMOS Technology. - Liang-Teck Pang; Kun Qian 014; Costas J. Spanos; Borivoje Nikolic (IEEE J. Solid State Circuits, 2009)

Technology variability from a design perspective. - Borivoje Nikolic; Bastien Giraud; Zheng Guo; Liang-Teck Pang; Ji-Hoon Park; Seng Oon Toh (CICC, 2010)

SRAM stability characterization using tunable ring oscillators in 45nm CMOS. - Jason Tsai; Seng Oon Toh; Zheng Guo; Liang-Teck Pang; Tsu-Jae King Liu; Borivoje Nikolic (ISSCC, 2010)

Technology Variability From a Design Perspective. - Borivoje Nikolic; Ji-Hoon Park; Jaehwa Kwak; Bastien Giraud; Zheng Guo; Liang-Teck Pang; Seng Oon Toh; Ruzica Jevtic; Kun Qian 014; Costas J. Spanos (IEEE Trans. Circuits Syst. I Regul. Pap., 2011)

A shorted global clock design for multi-GHz 3D stacked chips. - Liang-Teck Pang; Phillip J. Restle; Matthew R. Wordeman; Joel A. Silberman; Robert L. Franch; Gary W. Maier (VLSIC, 2012)