Polarity Dependency of MOL-TDDB in FinFET. - Manisha Sharma; Hokyung Park; Yinghong Zhao; Ki-Don Lee; Liangshan Chen; Joonah Yoon; Rakesh Ranjan; Caleb Dongkyan Kwon; Hyewon Shim; Myungsoo Yeo; Shin-Young Chung; Jon Haefner (IRPS, 2023)

Impacts of Post-Cu CMP Queue Time on Reliability. - Yinghong Zhao; Hokyung Park; Ki-Don Lee; Liangshan Chen; Manisha Sharma; Sugento Huandra; Hanson Mao; Brian Filemyr Smith; Wei Xia; Joonah Yoon; Junehwan Kim; Myungsoo Yeo; et al. (IRPS, 2024)

The Impact of Silicon Concentration on the Reliability of Tungsten Silicide. - Liangshan Chen; Yinghong Zhao; Ki-Don Lee; Manisha Sharma; Joonah Yoon; Timothy Davis; Kayla N. Sanders; Myungsoo Yeo; Amado Longoria; Shou-Liang Zhang; Ju Kwang Kim; Dung Dau; et al. (IRPS, 2025)