Minimizing Labeling, Maximizing Performance: A Novel Approach to Nanoscale Scanning Electron Microscope (SEM) Defect Segmentation. - Yibo Qiao; Weiping Xie; Shunyuan Lou; Qian Jin; Lichao Zeng; Yining Chen; Qi Sun 002; Cheng Zhuo (DAC, 2024)

DefectTrackNet: Efficient Root Cause Analysis of Wafer Defects in Semiconductor Manufacturing Using a Lightweight CNN-Transformer Architecture. - Lichao Zeng; Zhouzhouzhou Mei; Zhongyu Shi; Yining Chen (ASP-DAC, 2025)