Corrigendum to "A subgap density of states modeling for the transient characteristics in oxide-based thin-film transistors" [Microelectron. Reliab. 60 (2016) 67-69]. - Weiliang Wang; Karim Khan; Xingye Zhang; Haiming Qin; Jun Jiang; Lijing Miao; Kemin Jiang; Pengjun Wang; Mingzhi Dai; Junhao Chu (Microelectron. Reliab., 2016)