Method for proposing sort screen thresholds based on modeling etest/sort-class in semiconductor manufacturing. - Wai Kuan Yip; Lim Chun Chew; Wen Jau Lee (CASE, 2008)

A Modified Artificial Neural Network Learning Algorithm for Imbalanced Data Set Problem. - Asrul Adam; Mohd Ibrahim Shapiai; Zuwairie Ibrahim; Marzuki Khalid; Lim Chun Chew; Wen Jau Lee; Junzo Watada (CICSyN, 2010)

Learning with imbalanced datasets using fuzzy ARTMAP-based neural network models. - Shing Chiang Tan; Zuwairie Ibrahim; Wen Jau Lee; Junzo Watada; Marzuki Khalid; Lim Chun Chew (FUZZ-IEEE, 2011)

A Hybrid Artificial Neural Network-Naive Bayes for solving imbalanced dataset problems in semiconductor manufacturing test process. - Asrul Adam; Lim Chun Chew; Mohd Ibrahim Shapiai; Wen Jau Lee; Zuwairie Ibrahim; Marzuki Khalid (HIS, 2011)