The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation. - Lim Shi Xuen; Ismail Mohd Khairuddin; Mohd Azraai Mohd Razman; Jessnor Arif Mat-Jizat; Edmund Yuen; Haochuan Jiang; Eng Hwa Yap; Anwar P. P. Abdul Majeed (RiTA, 2022)