Scalable Short-Open-Interconnect S-Parameter De-Embedding Method for On-Wafer Microwave Characterization of Silicon MOSFETs. - Ming-Hsiang Cho; Yueh-Hua Wang; Lin-Kun Wu (IEICE Trans. Electron., 2007)

A Flexible Microwave De-Embedding Method for On-Wafer Noise Parameter Characterization of MOSFETs. - Yueh-Hua Wang; Ming-Hsiang Cho; Lin-Kun Wu (IEICE Trans. Electron., 2009)

Through-Silicon-Via Characterization and Modeling Using a Novel One-Port De-Embedding Technique. - An-Sam Peng; Ming-Hsiang Cho; Yueh-Hua Wang; Meng-Fang Wang; David Chen; Lin-Kun Wu (IEICE Trans. Electron., 2013)

An Improved EEHEMT RF Noise Model for 0.25 µm InGaP pHEMT Transistor Using Verilog-A Language. - An-Sam Peng; Lin-Kun Wu (IEICE Trans. Electron., 2017)

Analysis and Design of a CMOS Ultra-High-Speed Burst Mode Imager with In-Situ Storage Topology Featuring In-Pixel CDS Amplification. - Lin-Kun Wu; David San Segundo Bello; Philippe Coppejans; Jan Craninckx; Andreas Süss; Maarten Rosmeulen; Piet Wambacq; Jonathan Borremans (Sensors, 2018)

Compact Microstrip Wideband Cross-Coupled Inline Bandpass Filters With Miniaturized Stepped-Impedance Resonators (SIRs). - Shao-Chan Tang; Pei-Cheng Chu; Jen-Tsai Kuo; Lin-Kun Wu; Chun-Hung Lin (IEEE Access, 2022)