Defects, Fault Modeling, and Test Development Framework for FeFETs. - Changhao Wang; Sicong Yuan; Hanzhi Xun; Chaobo Li; Mottaqiallah Taouil; Moritz Fieback; Danyang Chen; Xiuyan Li; Lin Wang 111; Riccardo Cantoro; Chujun Yin; Said Hamdioui (ITC, 2024)

Device-Aware Test for Anomalous Charge Trapping in FeFETs. - Sicong Yuan; Changhao Wang; Moritz Fieback; Hanzhi Xun; Mottaqiallah Taouil; Xiuyan Li; Danyang Chen; Lin Wang 111; Nicolò Bellarmino; Riccardo Cantoro; Said Hamdioui (ASP-DAC, 2025)