Analyzing Multichip Module Testing Strategies. - Magdy S. Abadir; Ashish R. Parikh; Linda Bal; Peter Sandborn; Ken Drake (IEEE Des. Test Comput., 1994)

High Level Test Economics Advisor (Hi-TEA). - Magdy S. Abadir; Ashish Parikh; Linda Bal; Peter Sandborn; Cynthia F. Murphy (J. Electron. Test., 1994)

Multichip systems trade-off analysis tool. - Peter Sandborn; Rajarshi Ghosh; Ken Drake; Magdy S. Abadir; Linda Bal; Ashish Parikh (J. Electron. Test., 1994)