An intelligent pattern recognition method for machine fault diagnosis. - Linfeng Deng; Rongzhen Zhao (URAI, 2013)

A framework to develop intelligent information system for rotating machinery in a data-driven way. - Rongzhen Zhao; Linfeng Deng; Zhaohui Li (URAI, 2013)

LC-Type Energy Storage Converter and State Feedback Control Strategy Adapted to New Energy Power Station. - Qinghua Dai; Qixiang Li; Zhongwei Chen; Yichao Wang 003; Haifeng Yu; Linfeng Deng; Fujun Ma (ICITEE, 2019)

Explicit continuous I-V model for 2D transition metal dichalcogenide field-effect transistors. - Linfeng Deng; C. M. Si; H. Q. Huang; Jun Wang 054; He Wen; Seongil Im (Microelectron. J., 2019)

An analytical I-V model of SiC double-gate junctionless MOSFETs. - Yi Li 060; Tao Zhou; Zixuan Guo; Yuqiu Yang; Junyao Wu; Huan Cai; Jun Wang; Jungang Yin; Wenqing Huang; Miao Zhang; Nianxing Hou; Qin Liu; et al. (Microelectron. J., 2024)

An analytical subthreshold I-V model of SiC MOSFETs. - Yi Li 060; Tao Zhou; Geng Jiang; Liangbin Deng; Zixuan Guo; Qiaoling Sun; Bangyong Yin; Yuqiu Yang; Junyao Wu; Huan Cai; Jun Wang; Jungang Yin; et al. (Microelectron. J., 2024)

Plant Moisture Content Measurement System Based on Microwave Pseudo Waveguide. - Tao Zhou; Zixuan Guo; Qiaoling Sun; Yi Li 060; Liangbin Deng; Geng Jiang; Bangyong Yin; Yuqiu Yang; Junyao Wu; Huan Cai; Xi Jiang 005; Jungang Yin; et al. (IEEE Trans. Instrum. Meas., 2024)

SRCAE-STCBiGRU: a fused deep learning model for remaining useful life prediction of rolling bearings. - Linfeng Deng; Xinhui Yan; Wei Li (Signal Image Video Process., 2024)

Multimetric hypergraph embedding for dimensionality reduction in rotor fault diagnosis. - Yongfei Zhang; Yuqiao Zheng; Rongzhen Zhao; Linfeng Deng; Mingkuan Shi; Pengfei Chen; Kongyuan Wei (Adv. Eng. Informatics, 2025)

Dimensionality reduction of rolling bearing fault data based on graph-embedded semi-supervised deep auto-encoders. - Wei Kongyuan; Rongzhen Zhao; Haixia Kou; Pengfei Chen; Yongyong Cao; Yuqiao Zheng; Linfeng Deng (Eng. Appl. Artif. Intell., 2025)