A High Precision On-Line Detection Method for IGBT Junction Temperature Based on Stepwise Regression Algorithm. - Lingfeng Shao; Yi Hu; Guoqing Xu 002 (IEEE Access, 2020)

Research on the Gate Oxide Layer Aging Trend of Power Electronic Device. - Guoqing Xu 002; Lingfeng Shao; Weiwei Wei; Yanhui Zhang; Xuecheng Sun (IEEE Access, 2021)

A Novel IGBT Junction Temperature Detection Based on High-Frequency Model of Inductor Element. - Guoqing Xu 002; Lingfeng Shao; Wei Feng 009; Wei Zhu; Zhengyun Pan; Changle Li; Yanhui Zhang; Lei Xia (IEEE Trans. Instrum. Meas., 2023)