Defect Modeling During the SLM Process for Manufacturing Microwave Devices. - Shuai Li; Xiue Bao; Giovanni Gugliandolo; Haoyun Yuan; Jinkai Li; Linxiang Shao; Minghe Du; Nicola Donato; Zlatica Marinkovic; Giovanni Crupi; Lili Fang; Liming Si; et al. (MetroXRAINE, 2023)