TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. - David Trémouilles; Géraldine Bertrand; Marise Bafleur; Felix Beaudoin; Philippe Perdu; Nicolas Guitard; Lionel Lescouzères (Microelectron. Reliab., 2003)

Latch-up ring design guidelines to improve electrostatic discharge (ESD) protection scheme efficiency. - David Trémouilles; Marise Bafleur; Géraldine Bertrand; Nicolas Nolhier; Nicolas Mauran; Lionel Lescouzères (IEEE J. Solid State Circuits, 2004)

Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements. - Yuan Gao; Nicolas Guitard; Christophe Salamero; Marise Bafleur; Laurent Bary; Laurent Escotte; Patrick Gueulle; Lionel Lescouzères (Microelectron. Reliab., 2007)