On Backside Probing Techniques and Their Emerging Security Threats. - Liton Kumar Biswas; Leonidas Lavdas; M. Tanjidur Rahman; Mark Tehranipoor; Navid Asadizanjani (IEEE Des. Test, 2022)

US Microelectronics Packaging Ecosystem: Challenges and Opportunities. - Rouhan Noor; Himanandhan Reddy Kottur; Patrick J. Craig; Liton Kumar Biswas; M. Shafkat M. Khan; Nitin Varshney; Hamed Dalir; Elif Akçali; Bahar Ghane Motlagh; Charles Woychik; Yong-Kyu Yoon; Navid Asadizanjani (CoRR, 2023)

Detour-RS: Reroute Attack Vulnerability Assessment with Awareness of the Layout and Resource. - Minyan Gao; Liton Kumar Biswas; Navid Asadi; Domenic Forte (Cryptogr., 2024)

Toward Standardized Vulnerability Assessment of Advanced Packaging Against Probing Attacks. - M. Shafkat M. Khan; Liton Kumar Biswas; Himanandhan Reddy Kottur; Rouhan Noor; Nitin Varshney; Nelson Hastings; Navid Asadizanjani (IEEE Des. Test, 2025)