Investigation of deep traps in silicon-germanium epitaxial base bipolar transistors with a single polysilicon quasi self-aligned architecture. - Liviu Militaru; A. Souifi; M. Mouis; Alain Chantre; G. Brémond (Microelectron. Reliab., 2001)

Static and low-frequency noise characterization in submicron MOSFETs for memories cells applications. - Nabil Sghaier; M'Hamed Trabelsi; Ne. Sghaier; Liviu Militaru; Abdelkader Souifi; Adel Kalboussi; Noureddine Yacoubi (Microelectron. J., 2006)

Analysis of slow traps centres in submicron MOSFETs by random telegraph signal technique. - Nabil Sghaier; Liviu Militaru; M'Hamed Trabelsi; Yacoubi Yacoubi; Souifi Souifi (Microelectron. J., 2007)

Parameters extraction of hafnium based gate oxide capacitors. - T. Nguyen; C. Busseret; Liviu Militaru; A. Poncet; D. Aimé; Nicolas Baboux; Carole Plossu (Microelectron. Reliab., 2007)

Influence of the surrounding ambient on the reliability of the electrical characterization of thin oxide layers using an atomic force microscope. - W. Hourani; B. Gautier; Liviu Militaru; D. Albertini; A. Descamps-Mandine; R. Arinero (Microelectron. Reliab., 2011)

Electrical characterization and TCAD simulations of multi-gate bulk nMOSFET. - Inga Zbierska; Liviu Militaru; Françis Calmon; Sylvain Feruglio; Guo-Neng Lu (Microelectron. J., 2015)

Effect of interface traps for ultra-thin high-k gate dielectric based MIS devices on the capacitance-voltage characteristics. - Slah Hlali; Neila Hizem; Liviu Militaru; A. Kalboussi; Abdelkader Souifi (Microelectron. Reliab., 2017)

Multilayer OTS Selectors Engineering for High Temperature Stability, Scalability and High Endurance. - Camille Laguna; Mathieu Bernard; Nicolas Bernier; D. Rouchon; N. Rochat; Julien Garrione; A. Jannaud; Emmanuel Nolot; Valentina Meli; Niccolo Castellani; C. Sabbione; Guillaume Bourgeois; et al. (IMW, 2021)

Multilayer Structure in SeAsGeSi-based OTS for High Thermal Stability and Reliability Enhancement. - Camille Laguna; Mathieu Bernard; Julien Garrione; Niccolo Castellani; Valentina Meli; S. Martin; François Aussenac; D. Rouchon; N. Rochat; Emmanuel Nolot; Guillaume Bourgeois; Marie Claire Cyrille; et al. (ESSDERC, 2022)