Uneven Illumination Surface Defects Inspection Based on Saliency Detection and Intrinsic Image Decomposition. - Yuanhong Qiu; Lixin Tang 001; Bin Li 026; Suanlong Niu; Tongzhi Niu (IEEE Access, 2020)

Clear Memory-Augmented Auto-Encoder for Surface Defect Detection. - Wei Luo; Tongzhi Niu; Lixin Tang 001; Wenyong Yu; Bin Li 026 (CoRR, 2022)

A generalized well neural network for surface defect segmentation in Optical Communication Devices via Template-Testing comparison. - Tongzhi Niu; Zhiyu Xie 002; Jie Zhang; Lixin Tang 001; Bin Li 026; Hao Wang 048 (Comput. Ind., 2023)