Testing the Fleischer-Laker switched-capacitor biquad using the diagnosis-after-test procedure. - Shao-Feng Hung; Long-Yi Lin; Hao-Chiao Hong (ISOCC, 2012)

Design of a Fault-Injectable Fleischer-Laker Switched-Capacitor Biquad for Verifying the Static Linear Behavior Fault Model. - Long-Yi Lin; Hao-Chiao Hong (Asian Test Symposium, 2013)

A Cost-Effective Stimulus Generator for Battery Channel Characterization in Electric Vehicles. - Shao-Feng Hung; Long-Yi Lin; Hao-Chiao Hong (ATS, 2014)

A Study on the Transfer Function Based Analog Fault Model for Linear and Time-Invariant Continuous-Time Analog Circuits. - Hao-Chiao Hong; Long-Yi Lin (ATS, 2016)

An Enhanced Boundary Scan Architecture for Inter-Die Interconnect Leakage Measurement in 2.5D and 3D Packages. - Pok Man Preston Law; Cheng-Wen Wu; Long-Yi Lin; Hao-Chiao Hong (ATS, 2017)

Accurate and Fast On-Wafer Test Circuitry for Device Array Characterization in Wafer Acceptance Test. - Hao-Chiao Hong; Long-Yi Lin (IEEE Trans. Circuits Syst. I Regul. Pap., 2019)

Design of a 0.20-0.25-V, Sub-nW, Rail-to-Rail, 10-bit SAR ADC for Self-Sustainable IoT Applications. - Hao-Chiao Hong; Long-Yi Lin; Yi Chiu (IEEE Trans. Circuits Syst. I Regul. Pap., 2019)

Accurate and Fast On-Wafer Test Circuitry Integrated With a 140-dB-Input-Range Current Digitizer for Parameter Tests in WAT. - Long-Yi Lin; Hao-Chiao Hong (IEEE Trans. Circuits Syst. I Regul. Pap., 2022)

Ultra-Thin Bottom-Emission VCSEL-Based Optoelectronic Flexible Printed Circuit Module for High-Speed Transmission. - Zuhaib Khan; Chung-Yu Hong; Ming-Che Hsieh; Chun-I Wu; Long-Yi Lin; Chun-Chieh Chen; David Cheng (OFC, 2024)