Extraction of scalable electrical model for a SOI JFET using BSIM3 model. - Simona A. Cozzi; Lorenzo Labate; Roberto Stella (Microelectron. J., 2013)

Impact of layout and channel processing on CMOS low frequency noise variability. - Fausto Simioni; Lorenzo Labate; Daniele Savio; Mariella Brizzi; Federica Ottogalli; Riccardo Marchetti; Silvia Brazzelli; Mattia Rossetti (ESSDERC, 2023)