IJTAG Through a Two-Pin Chip Interface. - Manu Baby; Bernd Büttner; Piet Engelke; Ulrike Pfannkuchen; Reinhard Meier; Jonathan Gaudet; Jean-François Côté; Givargis Danialy 001; Martin Keim; Lori Schramm (ITC, 2020)

MBIST Supported Multi Step Trim for Reliable eMRAM Sensing. - Jongsin Yun; Benoit Nadeau-Dostie; Martin Keim; Lori Schramm; Cyrille Dray; El Mehdi Boujamaa; Khushal Gelda (ITC, 2020)

Transitioning eMRAM from Pilot Project to Volume Production. - Cyrille Dray; Khushal Gelda; Benoit Nadeau-Dostie; Wei Zou; Luc Romain; Jongsin Yun; Harshitha Kodali; Lori Schramm; Martin Keim (ITC, 2023)

Combining Built-In Redundancy Analysis with ECC for Memory Testing. - Luc Romain; Paul-Patrick Nordmann; Benoit Nadeau-Dostie; Lori Schramm; Martin Keim (ETS, 2024)

High-Bandwidth IJTAG over SSN. - Jonathan Gaudet; Jan Burchard; Matthias Kampmann; Jean-François Côté; Tim Callahan; Hung Ho Chai; Ivy Ee Hsia Lim; Lori Schramm; Olga Przybysz; Marta Stepniewska; Sascha Ochsenknecht; Michal Olejarz; et al. (ITC, 2024)

Diagnosis of intermittent faults and corresponding algorithm development beyond 5nm technologies. - Jaehoon Lee; Hyeonuk Son; Seohyun Kang; Dahyun Kang; Dongkwan Han; Jongsin Yun; Artur Pogiel; Etienne Racine; Krzysztof Jurga; Lori Schramm; Martin Keim (ITC, 2024)

A Novel BIST Method for Multi-Port Register Files. - Andy Chen; Vianney Choserot; Munish Kumar; Khushal Gelda; Shreyas Pramod Dixit; Wei Zou; Jongsin Yun; Harshitha Kodali; Albert Au; Lori Schramm; Martin Keim (ETS, 2025)

Optimized MBIST-Based MRAM Testing for Automotive MCUs to Achieve Superior Performance and Quality Assurance. - Vinayak Bharat Naik; Gregory Billus; Amit Kumar Shukla; Andre Vogel; Veit Kriegerstein; Patrick Scharf; Venkata Siva Komma; Johannes Mueller; Thomas Merbeth; Ralf Flemming; Ingolf Lorenz; Muthu Kumaran Nambi; et al. (ETS, 2025)