A new methodology for the statistical analysis of VLSI CMOS circuits and its application to flash memories. - Massimo Conti; Paolo Crippa; Simone Orcioni; Marcello Pesare; Claudio Turchetti; Loris Vendrame; Silvia Lucherini (ISCAS (5), 2002)

A modular test structure for CMOS mismatch characterization. - Massimo Conti; Paolo Crippa; Francesco Fedecostunte; Simone Orcioni; F. Ricciardi; Claudio Turchetti; Loris Vendrame (ISCAS (5), 2003)