Sensors for built-in alternate RF test. - Louay Abdallah; Haralampos-G. D. Stratigopoulos; Christophe Kelma; Salvador Mir (ETS, 2010)

Adaptive logical control of RF LNA performances for efficient energy consumption. - Rafik Khereddine; Louay Abdallah; Emmanuel Simeu; Salvador Mir; Fabio Cenni (VLSI-SoC, 2010)

On Replacing an RF Test with an Alternative Measurement: Theory and a Case Study. - Alexios Spyronasios; Louay Abdallah; Haralampos-G. D. Stratigopoulos; Salvador Mir (Asian Test Symposium, 2011)

Implicit test of high-speed analog circuits using non-intrusive sensors. - Louay Abdallah; Haralampos-G. D. Stratigopoulos; Salvador Mir (ECCTD, 2011)

RF Front-End Test Using Built-in Sensors. - Louay Abdallah; Haralampos-G. D. Stratigopoulos; Salvador Mir; Christophe Kelma (IEEE Des. Test Comput., 2011)

Testing RF circuits with true non-intrusive built-in sensors. - Louay Abdallah; Haralampos-G. D. Stratigopoulos; Salvador Mir; Josep Altet (DATE, 2012)

Accurate estimation of analog test metrics with extreme circuits. - Kamel Beznia; Ahcène Bounceur; Louay Abdallah; Ke Huang 001; Salvador Mir; Reinhardt Euler (ICECS, 2012)

Experiences with non-intrusive sensors for RF built-in test. - Louay Abdallah; Haralampos-G. D. Stratigopoulos; Salvador Mir; Christophe Kelma (ITC, 2012)

Multivariate statistical techniques for analog parametric test metrics estimation. - Ke Huang 001; Haralampos-G. D. Stratigopoulos; Louay Abdallah; Salvador Mir; Ahcène Bounceur (DTIS, 2013)

True non-intrusive sensors for RF built-in test. - Louay Abdallah; Haralampos-G. D. Stratigopoulos; Salvador Mir (ITC, 2013)

Defect-oriented non-intrusive RF test using on-chip temperature sensors. - Louay Abdallah; Haralampos-G. D. Stratigopoulos; Salvador Mir; Josep Altet (VTS, 2013)

Low-cost EVM built-in test of RF transceivers. - Ayssar Serhan; Louay Abdallah; Haralampos-G. D. Stratigopoulos; Salvador Mir (IDT, 2014)

Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes. - Josep Altet; Eduardo Aldrete-Vidrio; Ferran Reverter; Didac Gómez; José Luis González 001; Marvin Onabajo; José Silva-Martínez; B. Martineau; X. Perpiñà; Louay Abdallah; Haralampos-G. D. Stratigopoulos; Xavier Aragonès; et al. (MWSCAS, 2014)

Fast deployment of alternate analog test using Bayesian model fusion. - John Liaperdos; Haralampos-G. D. Stratigopoulos; Louay Abdallah; Yiorgos Tsiatouhas; Angela Arapoyanni; Xin Li (DATE, 2015)

Test and Calibration of RF Circuits Using Built-in Non-intrusive Sensors. - Athanasios Dimakos; Martin Andraud; Louay Abdallah; Haralampos-G. D. Stratigopoulos; Emmanuel Simeu; Salvador Mir (ISVLSI, 2015)

Dynamic Analog/RF Alternate Test Strategies Based on On-chip Learning. - Parth Kansara; Sharanabasavaraja Bheema Reddy; Louay Abdallah; Ke Huang 001 (J. Electron. Test., 2018)