Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model. - Jean-Max Dutertre; Vincent Beroulle; Philippe Candelier; Stephan De Castro; Louis-Barthelemy Faber; Marie-Lise Flottes; Philippe Gendrier; David Hély; Régis Leveugle; Paolo Maistri; Giorgio Di Natale; Athanasios Papadimitriou; et al. (FDTC, 2018)

The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks. - Jean-Max Dutertre; Vincent Beroulle; Philippe Candelier; Louis-Barthelemy Faber; Marie-Lise Flottes; Philippe Gendrier; David Hély; Régis Leveugle; Paolo Maistri; Giorgio Di Natale; Athanasios Papadimitriou; Bruno Rouzeyre (IOLTS, 2018)