Comprehensive statistical comparison of RTN and BTI in deeply scaled MOSFETs by means of 3D 'atomistic' simulation. - Salvatore M. Amoroso; Louis Gerrer; Stanislav Markov; Fikru Adamu-Lema; Asen Asenov (ESSDERC, 2012)

Impact of random dopant fluctuations on trap-assisted tunnelling in nanoscale MOSFETs. - Louis Gerrer; Stanislav Markov; Salvatore M. Amoroso; Fikru Adamu-Lema; Asen Asenov (Microelectron. Reliab., 2012)

RTN distribution comparison for bulk, FDSOI and FinFETs devices. - Louis Gerrer; Salvatore M. Amoroso; Razaidi Hussin; Asen Asenov (Microelectron. Reliab., 2014)

Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A review. - Louis Gerrer; Jie Ding; Salvatore M. Amoroso; Fikru Adamu-Lema; Razaidi Hussin; Dave Reid; Campbell Millar; A. Asenov (Microelectron. Reliab., 2014)

Experimental evidences and simulations of trap generation along a percolation path. - Louis Gerrer; Razaidi Hussin; Salvatore M. Amoroso; Jacopo Franco; Pieter Weckx; Marko Simicic; N. Horiguchi; Ben Kaczer; Tibor Grasser; Asen Asenov (ESSDERC, 2015)

Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow. - Razaidi Hussin; Louis Gerrer; Jie Ding; Liping Wang; Salvatore M. Amoroso; Binjie Cheng; Dave Reid; Pieter Weckx; Marko Simicic; Jacopo Franco; Annelies Vanderheyden; Danielle Vanhaeren; et al. (ESSDERC, 2015)

Unified approach for simulation of statistical reliability in nanoscale CMOS transistors from devices to circuits. - A. Asenov; Jie Ding; Dave Reid; Plamen Asenov; Salvatore M. Amoroso; Fikru Adamu-Lema; Louis Gerrer (ISCAS, 2015)

Comparison of Si < 100 > and < 110 > crystal orientation nanowire transistor reliability using Poisson-Schrödinger and classical simulations. - Louis Gerrer; Vihar P. Georgiev; Salvatore M. Amoroso; Ewan Towie; A. Asenov (Microelectron. Reliab., 2015)

Impact of spacer interface charges on performance and reliability of low temperature transistors for 3D sequential integration. - Tadeu Mota Frutuoso; Jose Lugo-Alvarez; Xavier Garros; Laurent Brunet; Joris Lacord; Louis Gerrer; Mikaël Cassé; Edoardo Catapano; Claire Fenouillet-Béranger; François Andrieu; Fred Gaillard; Philippe Ferrari (IRPS, 2021)

BTI Arbitrary Stress Patterns Characterization & Machine-Learning optimized CET Maps Simulations. - Louis Gerrer; Jacques Cluzel; Fred Gaillard; Xavier Garros; Xavier Federspiel; Florian Cacho; David Roy 001; E. Vincent (IRPS, 2021)