Investigation of Scaling and Temperature Effects in Total Ionizing Dose (TID) Experiments in 65 nm CMOS. - Loukas Chevas; Aristeidis Nikolaou; Matthias Bucher; Nikolaos Makris; Alexia Papadopoulou; Apostolos Zografos; Giulio Borghello; Henri D. Koch; Federico Faccio (MIXDES, 2018)

Extending a 65nm CMOS process design kit for high total ionizing dose effects. - Aristeidis Nikolaou; Matthias Bucher; Nikos Makris; Alexia Papadopoulou; Loukas Chevas; Giulio Borghello; Henri D. Koch; Kostas Kloukinas; Tuomas S. Poikela; Federico Faccio (MOCAST, 2018)

Compact Modeling of Low Frequency Noise and Thermal Noise in Junction Field Effect Transistors. - Nikolaos Makris; Loukas Chevas; Matthias Bucher (ESSDERC, 2019)

Forward and Reverse Operation of Enclosed-Gate MOSFETs and Sensitivity to High Total Ionizing Dose. - Aristeidis Nikolaou; Loukas Chevas; Alexia Papadopoulou; Nikolaos Makris; Matthias Bucher; Giulio Borghello; Federico Faccio (MIXDES, 2019)

Design of Micropower Operational Transconductance Amplifiers for High Total Ionizing Dose Effects. - Alexia Papadopoulou; Nikolaos Makris; Loukas Chevas; Aristeidis Nikolaou; Matthias Bucher (MOCAST, 2019)