High-resolution in-situ of gold electromigration: test time reduction. - Kris Croes; R. Dreesen; Jean Manca; Ward De Ceuninck; Luc De Schepper; Luc Tielemans; P. J. van der Wel (Microelectron. Reliab., 2001)

A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation. - R. Dreesen; Kris Croes; Jean Manca; Ward De Ceuninck; Luc De Schepper; A. Pergoot; Guido Groeseneken (Microelectron. Reliab., 2001)

Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluation. - R. Petersen; Ward De Ceuninck; Luc De Schepper; Olivier Vendier; Hervé Blanck; Dominique Pons (Microelectron. Reliab., 2001)

Statistical aspects of the degradation of LDD nMOSFETs. - E. Andries; R. Dreesen; Kris Croes; Ward De Ceuninck; Luc De Schepper; Guido Groeseneken; K. F. Lo; Marc D'Olieslaeger; Jan D'Haen (Microelectron. Reliab., 2002)

High-resolution SILC measurements of thin SiO2 at ultra low voltages. - Stefano Aresu; Ward De Ceuninck; R. Dreesen; Kris Croes; E. Andries; Jean Manca; Luc De Schepper; Robin Degraeve; Ben Kaczer; Marc D'Olieslaeger (Microelectron. Reliab., 2002)

Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology. - R. Petersen; Ward De Ceuninck; Jan D'Haen; Marc D'Olieslaeger; Luc De Schepper; Olivier Vendier; Hervé Blanck; Dominique Pons (Microelectron. Reliab., 2002)

A new method for the analysis of high-resolution SILC data. - Stefano Aresu; Ward De Ceuninck; G. Knuyt; J. Mertens; Jean Manca; Luc De Schepper; Robin Degraeve; Ben Kaczer; Marc D'Olieslaeger; Jan D'Haen (Microelectron. Reliab., 2003)

MIMC reliability and electrical behavior defined by a physical layer property of the dielectric. - Jan Ackaert; R. Charavel; K. Dhondt; B. Vlachakis; Luc De Schepper; M. Millecam; E. Vandevelde; P. Bogaert; A. Iline; Eddy De Backer; Alexandru Vlad; Jean-Pierre Raskin (Microelectron. Reliab., 2008)