Implementing Design-for-Test Within a Tile-Based Design Methodology - Challenges and Solutions. - Venkat Yellapragada; Suresh Raman; Banadappa Shivaray; Luc Romain; Benoit Nadeau-Dostie; Martin Keim; Jean-Francois Cote; Albert Au; Giri Podichetty; Ashok Anbalan (ITC-Asia, 2018)

Memory repair logic sharing techniques and their impact on yield. - Benoit Nadeau-Dostie; Luc Romain (ITC, 2020)

Transitioning eMRAM from Pilot Project to Volume Production. - Cyrille Dray; Khushal Gelda; Benoit Nadeau-Dostie; Wei Zou; Luc Romain; Jongsin Yun; Harshitha Kodali; Lori Schramm; Martin Keim (ITC, 2023)

Combining Built-In Redundancy Analysis with ECC for Memory Testing. - Luc Romain; Paul-Patrick Nordmann; Benoit Nadeau-Dostie; Lori Schramm; Martin Keim (ETS, 2024)

Optimized MBIST-Based MRAM Testing for Automotive MCUs to Achieve Superior Performance and Quality Assurance. - Vinayak Bharat Naik; Gregory Billus; Amit Kumar Shukla; Andre Vogel; Veit Kriegerstein; Patrick Scharf; Venkata Siva Komma; Johannes Mueller; Thomas Merbeth; Ralf Flemming; Ingolf Lorenz; Muthu Kumaran Nambi; et al. (ETS, 2025)

Holistic Memory DFT Partitioning Using a Convolution-Based Algorithm. - Olivier Romain; Wojciech Gierszal; Luc Romain; Artur Pogiel (ETS, 2025)