Dynamic defect localization using FPGA to monitor digital values. - Luc Saury; S. Cany (Microelectron. Reliab., 2011)

Parametric defect localization on integrated circuits - From static laser stimulation to real-time variation mapping (RTVM). - Luc Saury (Microelectron. Reliab., 2014)

Effective scan chain failure analysis method. - Etienne Auvray; Paul Armagnat; Luc Saury; Maheshwaran Jothi; Michael Brügel (Microelectron. Reliab., 2017)

Relevant Signals and Devices for Failure Analysis of Analog and Mixed-signal Circuits. - Tommaso Melis; Emmanuel Simeu; Luc Saury; Etienne Auvray (ITC, 2021)

Improved Fault Diagnosis of Analog Circuits using Light Emission Measures. - Tommaso Melis; Emmanuel Simeu; Etienne Auvray; Luc Saury (LATS, 2021)

Light Emission Tracking and Measurements for Analog Circuits Fault Diagnosis in Automotive Applications. - Tommaso Melis; Emmanuel Simeu; Etienne Auvray; Luc Saury (J. Electron. Test., 2023)