High-resolution in-situ of gold electromigration: test time reduction. - Kris Croes; R. Dreesen; Jean Manca; Ward De Ceuninck; Luc De Schepper; Luc Tielemans; P. J. van der Wel (Microelectron. Reliab., 2001)

How reliable are reliability tests? - Luc Tielemans; R. Rongen; Ward De Ceuninck (Microelectron. Reliab., 2002)