Accelerated reliability testing of flash memory: Accuracy and issues on a 45nm NOR technology. - Marcello Calabrese; Carmine Miccoli; Christian Monzio Compagnoni; Luca Chiavarone; Silvia Beltrami; Andrea Parisi; Sebastiano Bartolone; Andrea L. Lacaita; Alessandro S. Spinelli; Angelo Visconti (ICICDT, 2013)

Depassivation of Traps in the Polysilicon Channel of 3D NAND Flash Arrays: Impact on Cell High-Temperature Data Retention. - Mattia Giulianini; Gerardo Malavena; Luca Chiavarone; Alessandro S. Spinelli; Christian Monzio Compagnoni (IRPS, 2023)

Experimental Segmentation of Vertical Charge Loss Mechanisms in Charge Trap-Based 3D NAND Arrays. - Luca Chiavarone; Gianluca Nicosia; Niccolò Righetti; Yingda Dong (IRPS, 2024)

Cryogenic Investigation of Vertical Charge Loss in 3D NAND Flash Memories. - D. G. Refaldi; Gerardo Malavena; Luca Chiavarone; N. Gagliazzi; Alessandro S. Spinelli; C. Monzio Compagnoni (IRPS, 2025)