Read disturb in flash memories: reliability case. - P. Tanduo; Luca Cola; S. Testa; M. Menchise; A. Mervic (Microelectron. Reliab., 2006)

Read disturb on flash memories: Study on temperature annealing effect. - Luca Cola; M. De Tomasi; Riccardo Enrici Vaion; A. Mervic; P. Zabberoni (Microelectron. Reliab., 2012)