Impact of the As dose in 0.35 mum EEPROM technology: characterization and modeling. - N. Galbiati; G. Ghidini; C. Cremonesi; Luca Larcher (Microelectron. Reliab., 2001)

A complete model of E2PROM memory cells for circuit simulations. - Paolo Pavan; Luca Larcher; Massimiliano Cuozzo; Paola Zuliani; Antonino Conte (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2003)

Balanced CMOS LC-tank analog frequency dividers for quadrature LO generation. - Andrea Mazzanti; Luca Larcher; Francesco Svelto (CICC, 2005)

Flash Memories for SoC: An Overview on System Constraints and Technology Issues, invited. - Luca Larcher; Paolo Pavan; Alfonso Maurelli (IWSOC, 2005)

Analysis of reliability and power efficiency in cascode class-E PAs. - Andrea Mazzanti; Luca Larcher; Riccardo Brama; Francesco Svelto (IEEE J. Solid State Circuits, 2006)

A 1.7-GHz 31dBm differential CMOS Class-E Power Amplifier with 58% PAE. - Riccardo Brama; Luca Larcher; Andrea Mazzanti; Francesco Svelto (CICC, 2007)

CMOS balanced regenerative frequency dividers for wide-band quadrature LO generation. - Andrea Mazzanti; Luca Larcher; Francesco Svelto (Microelectron. J., 2007)

A 30.5 dBm 48% PAE CMOS Class-E PA With Integrated Balun for RF Applications. - Riccardo Brama; Luca Larcher; Andrea Mazzanti; Francesco Svelto (IEEE J. Solid State Circuits, 2008)

Modeling and Optimization of a Solar Energy Harvester System for Self-Powered Wireless Sensor Networks. - Denis Dondi; Alessandro Bertacchini; Davide Brunelli; Luca Larcher; Luca Benini (IEEE Trans. Ind. Electron., 2008)

A MEMS reconfigurable quad-band Class-E Power Amplifier for GSM standard. - Luca Larcher; Riccardo Brama; Marcello Ganzerli; Jacopo Iannacci; Marco Bedani; Antonio Gnudi (DATE, 2009)

Load Optimization of an Inductive Power Link for Remote Powering of Biomedical Implants. - Kanber Mithat Silay; Denis Dondi; Luca Larcher; Michel J. Declercq; Luca Benini; Yusuf Leblebici; Catherine Dehollain (ISCAS, 2009)

Photovoltaic scavenging systems: Modeling and optimization. - Davide Brunelli; Denis Dondi; Alessandro Bertacchini; Luca Larcher; Paolo Pavan; Luca Benini (Microelectron. J., 2009)

Millimeter-wave 14dBm CMOS power amplifier with input-output distributed transformers. - Andrea Pallotta; Wissam Eyssa; Luca Larcher; Riccardo Brama (CICC, 2010)

Fundamental reliability issues of advanced charge-trapping Flash memory devices. - Luca Larcher; Andrea Padovani (ICECS, 2010)

High-kappa related reliability issues in advanced non-volatile memories. - Luca Larcher; Andrea Padovani (Microelectron. Reliab., 2010)

An inductor-less 13.5-Gbps 8-mW analog equalizer for multi-channel multi-frequency operation. - Marcello Ganzerli; Luca Larcher; Simone Erba; Davide Sanzogni (ISCAS, 2011)

A 868MHz CMOS RF-DC power converter with -17dBm input power sensitivity and efficiency higher than 40% over 14dB input power range. - Stefano Scorcioni; Alessandro Bertacchini; Luca Larcher (ESSCIRC, 2012)

Random Telegraph Signal noise properties of HfOx RRAM in high resistive state. - Francesco Maria Puglisi; Paolo Pavan; Andrea Padovani; Luca Larcher; Gennadi Bersuker (ESSDERC, 2012)

Enhancing safety in vehicles with implement or trailer using an autonomous wireless sensor network system. - Denis Dondi; Alessandro Bertacchini; Stefano Scorcioni; Luca Larcher; Paolo Pavan (ICVES, 2012)

An autonomous wireless sensor network device powered by a RF energy harvesting system. - Denis Dondi; Stefano Scorcioni; Alessandro Bertacchini; Luca Larcher; Paolo Pavan (IECON, 2012)

Connecting RRAM performance to the properties of the hafnia-based dielectrics. - Gennadi Bersuker; Brian Butcher; David Gilmer; Paul Kirsch; Luca Larcher; Andrea Padovani (ESSDERC, 2013)

Random telegraph noise analysis to investigate the properties of active traps of HfO2-based RRAM in HRS. - Francesco Maria Puglisi; Paolo Pavan; Andrea Padovani; Luca Larcher (ESSDERC, 2013)

A compact model of hafnium-oxide-based resistive random access memory. - Francesco Maria Puglisi; Paolo Pavan; Andrea Padovani; Luca Larcher (ICICDT, 2013)

Compact modeling of TANOS program/erase operations for SPICE-like circuit simulations. - Andrea Padovani; Luca Larcher; Paolo Pavan (Microelectron. J., 2013)

Analysis of RTN and cycling variability in HfO2 RRAM devices in LRS. - Francesco Maria Puglisi; Paolo Pavan; Luca Larcher; Andrea Padovani (ESSDERC, 2014)

Active safety system with RF energy harvesting capabilities for industrial applications using interchangeable implements. - Alessandro Bertacchini; Stefano Scorcioni; Luca Larcher; Giacomantonio Napoletano; Paolo Pavan (IECON, 2014)

Characterization of anomalous Random Telegraph Noise in Resistive Random Access Memory. - Francesco Maria Puglisi; Luca Larcher; Andrea Padovani; Paolo Pavan (ESSDERC, 2015)

A microscopic physical description of RTN current fluctuations in HfOx RRAM. - Francesco Maria Puglisi; Paolo Pavan; Luca Vandelli; Andrea Padovani; Matteo Bertocchi; Luca Larcher (IRPS, 2015)

Substrate and temperature influence on the trap density distribution in high-k III-V MOSFETs. - G. Sereni; Luca Vandelli; Roberto Cavicchioli; Luca Larcher; Dmitry Veksler; Gennadi Bersuker (IRPS, 2015)

Probing defects generation during stress in high-κ/metal gate FinFETs by random telegraph noise characterization. - Francesco Maria Puglisi; Felipe Costantini; Ben Kaczer; Luca Larcher; Paolo Pavan (ESSDERC, 2016)

Wireless sensor systems with energy harvesting capabilities for safety enhancement in agricultural vehicles. - Alessandro Bertacchini; Luca Larcher (ICIT, 2016)

Force impact effect in contact-mode triboelectric energy harvesters: Characterization and modeling. - Marco Lasagni; Paolo Pavan; Alessandro Bertacchini; Luca Larcher (IEEE SENSORS, 2016)

Multiscale modeling of electron-ion interactions for engineering novel electronic devices and materials. - Luca Larcher; Francesco Maria Puglisi; Andrea Padovani; Luca Vandelli; Paolo Pavan (PATMOS, 2016)

Bipolar Resistive RAM Based on HfO2: Physics, Compact Modeling, and Variability Control. - Francesco Maria Puglisi; Luca Larcher; Andrea Padovani; Paolo Pavan (IEEE J. Emerg. Sel. Topics Circuits Syst., 2016)

System With RF Power Delivery Capabilities for Active Safety Enhancement in Industrial Vehicles Using Interchangeable Implements. - Alessandro Bertacchini; Giacomantonio Napoletano; Stefano Scorcioni; Luca Larcher; Paolo Pavan (IEEE Trans. Intell. Transp. Syst., 2016)

A new verilog-A compact model of random telegraph noise in oxide-based RRAM for advanced circuit design. - Francesco Maria Puglisi; Nicolo Zagni; Luca Larcher; Paolo Pavan (ESSDERC, 2017)

A multiscale modeling approach for the simulation of OxRRAM devices. - Andrea Padovani; Luca Larcher; Jiyong Woo; Hyunsang Hwang (NVMTS, 2017)

Correlated Effects on Forming and Retention of Al Doping in HfO2-Based RRAM. - Mouhamad Alayan; Elisa Vianello; Barbara De Salvo; Luca Perniola; Andrea Padovani; Luca Larcher (IEEE Des. Test, 2017)

Characterization and Modeling of Low-Cost Contact-Mode Triboelectric Devices for Energy Harvesting. - Alessandro Bertacchini; Marco Lasagni; Gabriele Sereni; Luca Larcher; Paolo Pavan (IECON, 2018)

Role of electron and hole trapping in the degradation and breakdown of SiO2 and HfO2 films. - David Z. Gao; Jack Strand; Al-Moatasem El-Sayed; Alexander L. Shluger; Andrea Padovani; Luca Larcher (IRPS, 2018)

Time-dependent dielectric breakdown statistics in SiO2 and HfO2 dielectrics: Insights from a multi-scale modeling approach. - Andrea Padovani; Luca Larcher (IRPS, 2018)

Understanding and Variability of Lateral Charge Migration in 3D CT-NAND Flash with and Without Band-Gap Engineered Barriers. - Andrea Padovani; Milan Pesic; Mondol Anik Kumar; Pieter Blomme; Alexandre Subirats; Senthil Vadakupudhupalayam; Zunaid Baten; Luca Larcher (IRPS, 2019)

Variability sources and reliability of 3D - FeFETs. - Milan Pesic; Bastien Beltrando; Andrea Padovani; Shruba Gangopadhyay; Muthukumar Kaliappan; Michael Haverty; Marco A. Villena; Enrico Piccinini; Matteo Bertocchi; Tony Chiang; Luca Larcher; Jack Strand; et al. (IRPS, 2021)

Variability and disturb sources in ferroelectric 3D NANDs and comparison to Charge-Trap equivalents. - Milan Pesic; Andrea Padovani; Tommaso Rollo; Bastien Beltrando; Jack Strand; Parnika Agrawal; Alexander L. Shluger; Luca Larcher (IMW, 2022)

Reliability of Non-Volatile Memory Devices for Neuromorphic Applications: A Modeling Perspective (Invited). - Andrea Padovani; Milan Pesic; Federico Nardi; Valerio Milo; Luca Larcher; Mondol Anik Kumar; Zunaid Baten (IRPS, 2022)

Electron-assisted switching in FeFETs: Memory window dynamics - retention - trapping mechanisms and correlation. - Milan Pesic; Bastien Beltrando; Andrea Padovani; Toshihiko Miyashita; Nam-Sung Kim; Luca Larcher (IRPS, 2022)

Towards a Universal Model of Dielectric Breakdown. - Andrea Padovani; Paolo La Torraca; Jack Strand; Alexander L. Shluger; Valerio Milo; Luca Larcher (IRPS, 2023)

Insights into device and material origins and physical mechanisms behind cross temperature in 3D NAND. - Milan Pesic; Bastien Beltrando; Tommaso Rollo; Cristian Zambelli; Andrea Padovani; Rino Micheloni; Rita Maji; Lisa Enman; Mark Saly; Yang Ho Bae; Jung-Bae Kim; Dong Kil Yim; et al. (IRPS, 2023)

Self-rectifying non-volatile tunneling synapse: multiscale modeling augmented development. - Bastien Beltrando; Marco A. Villena; Mondol Anik Kumar; Shruba Gangopadhyay; Deepak Kamalanathan; E. Smith; Nasrin Kazem; Ghazal Saheli; Stephen Weeks; Michael Haverty; Muthukumar Kaliappan; Andrea Padovani; et al. (IMW, 2024)

Low-PBTS defect-engineered high-mobility metal-oxide BEOL transistors. - Bastien Beltrando; Bruno Coppolelli; Jung-Bae Kim; Yang Ho Bae; Stephen Weeks; Lisa Enman; Ghazal Saheli; Davide Cornigli; Stuart Brinkley; Mark Saly; Luca Larcher; Dong Kil Yim; et al. (IRPS, 2024)

Characterization and Multiscale Modeling of TDDB in State-of-the-art BEOL. - Andrea Palmieri; Mahdi Tavakoli; Chi Ching; Wenkai Zheng; Shi You; Xiaodong Zhang; Davide Cornigli; Michael Haverty; Navneet Singh; Luca Larcher; Monika Jamieson; Ajay Bhatnagar; et al. (IRPS, 2024)

Blocking Oxide Material Engineering to Improve Retention Loss in 3D NAND: a Modeling Process Optimization Study. - Tommaso Rollo; Hansel Lo; Luca Larcher; Christopher Olsen; Milan Pesic (IRPS, 2024)

Simulation of Ge-rich PCM Device Material Evolution from Post-Deposition Anneal to Programming Operations. - Enrico Piccinini; Nicola Giuliani; Matteo Baldo; Elisa Petroni; S. Calvi; L. Laurin; Federico Nardi; Andrea Redaelli; Roberto Annunziata; Luca Larcher (IMW, 2025)

Impact of Al-based Dipole Formation on Gate Stack Integrity and Reliability. - Bruno Coppolelli; Davide Cornigli; Zheyuan Chen; Andrea Padovani; Sara Vecchi; Yanliu Dang; Luc Thomas; Luca Vandelli; Jianxin Lei; Naomi Yoshida; Renu Whig; Federico Nardi; et al. (IRPS, 2025)

Multi-Scale Modeling-Driven Material to Device Co-Optimization of Ferroelectric Capacitors with Oxygen Reservoir Layer (ORL) for Improved Endurance. - Andrea Padovani; Nashrah Afroze; Yu-Hsin Kuo; Priyankka Gundlapudi Ravikumar; Prasanna Venkatesan Ravindran; Mengkun Tian; Asif Khan; Jihoon Choi; Jun Hee Lee; Luca Larcher; Gaurav Thareja (IRPS, 2025)

Understanding Correlation Between Memory Window Closure, Leakage and Read Delay Effects for FEFET Reliability Improvement: Role of IL and FE Traps. - Priyankka Gundlapudi Ravikumar; Andrea Padovani; Prasanna Venkatesan Ravindran; Chinsung Park; Nashrah Afroze; Mengkun Tian; Suman Datta; Shimeng Yu; Luca Larcher; Gaurav Thareja; Asif Khan (IRPS, 2025)

Enhanced Memory Performance in Ferroelectric NAND Applications: The Role of Tunnel Dielectric Position for Robust 10-Year Retention. - Prasanna Venkatesan Ravindran; Andrea Padovani; Lance Fernandes; Priyankka Gundlapudi Ravikumar; Chinsung Park; Huy Tran; Zekai Wang; Hari Jayasankar; Amrit Garlapati; Taeyoung Song; Hang Chen; Winston Chern; et al. (IRPS, 2025)

A Novel D2 Plasma Treatment for Defect Passivation: From Modeling to Process Optimization. - Sara Vecchi; Vikram Bhosle; Andrea Palmieri; Davide Cornigli; Fabrizio Buscemi; Andrea Padovani; Deven Raj; Andrew Cockburn; Lucien Date; Gaurav Thareja; Federico Nardi; Luca Larcher (IRPS, 2025)